Lisa Deerr. Automatic Calibration for a VLSI Test System. In Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983. pages 181-187, IEEE Computer Society, 1983.
@inproceedings{Deerr83,
title = {Automatic Calibration for a VLSI Test System},
author = {Lisa Deerr},
year = {1983},
tags = {testing},
researchr = {https://researchr.org/publication/Deerr83},
cites = {0},
citedby = {0},
pages = {181-187},
booktitle = {Proceedings International Test Conference 1983, Philadelphia, PA, USA, October 1983},
publisher = {IEEE Computer Society},
}