Enrique Dehaerne, Bappaditya Dey, Sandip Halder. A Comparative Study of Deep-Learning Object Detectors for Semiconductor Defect Detection. In 29th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2022, Glasgow, United Kingdom, October 24-26, 2022. pages 1-2, IEEE, 2022. [doi]
Abstract is missing.