Ofer Dekel, Ohad Shamir. Learning to classify with missing and corrupted features. In William W. Cohen, Andrew McCallum, Sam T. Roweis, editors, Machine Learning, Proceedings of the Twenty-Fifth International Conference (ICML 2008), Helsinki, Finland, June 5-9, 2008. Volume 307 of ACM International Conference Proceeding Series, pages 216-223, ACM, 2008. [doi]
@inproceedings{DekelS08,
title = {Learning to classify with missing and corrupted features},
author = {Ofer Dekel and Ohad Shamir},
year = {2008},
doi = {10.1145/1390156.1390184},
url = {http://doi.acm.org/10.1145/1390156.1390184},
researchr = {https://researchr.org/publication/DekelS08},
cites = {0},
citedby = {0},
pages = {216-223},
booktitle = {Machine Learning, Proceedings of the Twenty-Fifth International Conference (ICML 2008), Helsinki, Finland, June 5-9, 2008},
editor = {William W. Cohen and Andrew McCallum and Sam T. Roweis},
volume = {307},
series = {ACM International Conference Proceeding Series},
publisher = {ACM},
isbn = {978-1-60558-205-4},
}