Ofer Dekel, Ohad Shamir. Learning to classify with missing and corrupted features. In William W. Cohen, Andrew McCallum, Sam T. Roweis, editors, Machine Learning, Proceedings of the Twenty-Fifth International Conference (ICML 2008), Helsinki, Finland, June 5-9, 2008. Volume 307 of ACM International Conference Proceeding Series, pages 216-223, ACM, 2008. [doi]
Abstract is missing.