Empirical mode decomposition: an analytical approach for sifting process

Éric Deléchelle, Jacques Lemoine, Oumar Niang. Empirical mode decomposition: an analytical approach for sifting process. IEEE Signal Process. Lett., 12(11):764-767, 2005. [doi]

Authors

Éric Deléchelle

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Jacques Lemoine

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Oumar Niang

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