Empirical mode decomposition: an analytical approach for sifting process

Éric Deléchelle, Jacques Lemoine, Oumar Niang. Empirical mode decomposition: an analytical approach for sifting process. IEEE Signal Process. Lett., 12(11):764-767, 2005. [doi]

@article{DelechelleLN05,
  title = {Empirical mode decomposition: an analytical approach for sifting process},
  author = {Éric Deléchelle and Jacques Lemoine and Oumar Niang},
  year = {2005},
  doi = {10.1109/LSP.2005.856878},
  url = {http://dx.doi.org/10.1109/LSP.2005.856878},
  researchr = {https://researchr.org/publication/DelechelleLN05},
  cites = {0},
  citedby = {0},
  journal = {IEEE Signal Process. Lett.},
  volume = {12},
  number = {11},
  pages = {764-767},
}