Charles-Alban Deledalle, Florence Tupin, Loïc Denis. Patch similarity under non Gaussian noise. In Benoît Macq, Peter Schelkens, editors, 18th IEEE International Conference on Image Processing, ICIP 2011, Brussels, Belgium, September 11-14, 2011. pages 1845-1848, IEEE, 2011. [doi]
Abstract is missing.