Jeroen Delvaux, Ingrid Verbauwhede. Fault Injection Modeling Attacks on 65 nm Arbiter and RO Sum PUFs via Environmental Changes. IEEE Trans. on Circuits and Systems, 61-I(6):1701-1713, 2014. [doi]
@article{DelvauxV14-1, title = {Fault Injection Modeling Attacks on 65 nm Arbiter and RO Sum PUFs via Environmental Changes}, author = {Jeroen Delvaux and Ingrid Verbauwhede}, year = {2014}, doi = {10.1109/TCSI.2013.2290845}, url = {http://dx.doi.org/10.1109/TCSI.2013.2290845}, researchr = {https://researchr.org/publication/DelvauxV14-1}, cites = {0}, citedby = {0}, journal = {IEEE Trans. on Circuits and Systems}, volume = {61-I}, number = {6}, pages = {1701-1713}, }