Fault Injection Modeling Attacks on 65 nm Arbiter and RO Sum PUFs via Environmental Changes

Jeroen Delvaux, Ingrid Verbauwhede. Fault Injection Modeling Attacks on 65 nm Arbiter and RO Sum PUFs via Environmental Changes. IEEE Trans. on Circuits and Systems, 61-I(6):1701-1713, 2014. [doi]

Abstract

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