Bayes Optimal Multilabel Classification via Probabilistic Classifier Chains

Krzysztof Dembczynski, Weiwei Cheng, Eyke Hüllermeier. Bayes Optimal Multilabel Classification via Probabilistic Classifier Chains. In Johannes Fürnkranz, Thorsten Joachims, editors, Proceedings of the 27th International Conference on Machine Learning (ICML-10), June 21-24, 2010, Haifa, Israel. pages 279-286, Omnipress, 2010. [doi]

Abstract

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