Krzysztof Dembczynski, Willem Waegeman, Weiwei Cheng, Eyke Hüllermeier. Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss. In José L. Balcázar, Francesco Bonchi, Aristides Gionis, Michèle Sebag, editors, Machine Learning and Knowledge Discovery in Databases, European Conference, ECML PKDD 2010, Barcelona, Spain, September 20-24, 2010, Proceedings, Part I. Volume 6321 of Lecture Notes in Computer Science, pages 280-295, Springer, 2010. [doi]
@inproceedings{DembczynskiWCH10,
title = {Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss},
author = {Krzysztof Dembczynski and Willem Waegeman and Weiwei Cheng and Eyke Hüllermeier},
year = {2010},
doi = {10.1007/978-3-642-15880-3_24},
url = {http://dx.doi.org/10.1007/978-3-642-15880-3_24},
tags = {classification, analysis},
researchr = {https://researchr.org/publication/DembczynskiWCH10},
cites = {0},
citedby = {0},
pages = {280-295},
booktitle = {Machine Learning and Knowledge Discovery in Databases, European Conference, ECML PKDD 2010, Barcelona, Spain, September 20-24, 2010, Proceedings, Part I},
editor = {José L. Balcázar and Francesco Bonchi and Aristides Gionis and Michèle Sebag},
volume = {6321},
series = {Lecture Notes in Computer Science},
publisher = {Springer},
isbn = {978-3-642-15879-7},
}