Krzysztof Dembczynski, Willem Waegeman, Weiwei Cheng, Eyke Hüllermeier. Regret Analysis for Performance Metrics in Multi-Label Classification: The Case of Hamming and Subset Zero-One Loss. In José L. Balcázar, Francesco Bonchi, Aristides Gionis, Michèle Sebag, editors, Machine Learning and Knowledge Discovery in Databases, European Conference, ECML PKDD 2010, Barcelona, Spain, September 20-24, 2010, Proceedings, Part I. Volume 6321 of Lecture Notes in Computer Science, pages 280-295, Springer, 2010. [doi]
Abstract is missing.