Marcello Demi, Elisabetta Bianchini, Francesco Faita, Vincenzo Gemignani. Contour Tracking When Two Gray-Level Discontinuities Are Close to Each Other. In José Ruiz-Shulcloper, Walter G. Kropatsch, editors, Progress in Pattern Recognition, Image Analysis and Applications, 13th Iberoamerican Congress on Pattern Recognition, CIARP 2008, Havana, Cuba, September 9-12, 2008. Proceedings. Volume 5197 of Lecture Notes in Computer Science, pages 585-592, Springer, 2008. [doi]
Abstract is missing.