Frank Demmerle. Integrated RF-CMOS Transceivers challenge RF Test. In Scott Davidson, Anne Gattiker, editors, 2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006. pages 1-8, IEEE, 2006. [doi]
@inproceedings{Demmerle06, title = {Integrated RF-CMOS Transceivers challenge RF Test}, author = {Frank Demmerle}, year = {2006}, doi = {10.1109/TEST.2006.297704}, url = {http://dx.doi.org/10.1109/TEST.2006.297704}, researchr = {https://researchr.org/publication/Demmerle06}, cites = {0}, citedby = {0}, pages = {1-8}, booktitle = {2006 IEEE International Test Conference, ITC 2006, Santa Clara, CA, USA, October 22-27, 2006}, editor = {Scott Davidson and Anne Gattiker}, publisher = {IEEE}, isbn = {1-4244-0292-1}, }