Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform

Yong Deng 0002, Ting Chen, Di Zhang. Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform. J. Electronic Testing, 36(4):485-498, 2020. [doi]

@article{DengCZ20,
  title = {Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform},
  author = {Yong Deng 0002 and Ting Chen and Di Zhang},
  year = {2020},
  doi = {10.1007/s10836-020-05889-y},
  url = {https://doi.org/10.1007/s10836-020-05889-y},
  researchr = {https://researchr.org/publication/DengCZ20},
  cites = {0},
  citedby = {0},
  journal = {J. Electronic Testing},
  volume = {36},
  number = {4},
  pages = {485-498},
}