Yong Deng 0002, Ting Chen, Di Zhang. Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform. J. Electronic Testing, 36(4):485-498, 2020. [doi]
@article{DengCZ20, title = {Diagnosis of Incipient Faults in Nonlinear Analog Circuits Based on High Order Moment Fractional Transform}, author = {Yong Deng 0002 and Ting Chen and Di Zhang}, year = {2020}, doi = {10.1007/s10836-020-05889-y}, url = {https://doi.org/10.1007/s10836-020-05889-y}, researchr = {https://researchr.org/publication/DengCZ20}, cites = {0}, citedby = {0}, journal = {J. Electronic Testing}, volume = {36}, number = {4}, pages = {485-498}, }