Shuixin Deng, Lei Deng, Xiangze Meng, Ting Sun, Baohua Chen, Zhixiang Chen 0003, Hao Hu, Yusen Xie, Hanxi Yin, Shijie Yu. EHIR: Energy-based Hierarchical Iterative Image Registration for Accurate PCB Defect Detection. Pattern Recognition Letters, 185:38-44, 2024. [doi]
Abstract is missing.