Ding Deng, Yang Guo, Zhentao Li. A Parallel Test Application Method towards Power Reduction. J. Electronic Testing, 33(2):157-169, 2017. [doi]
@article{DengGL17,
title = {A Parallel Test Application Method towards Power Reduction},
author = {Ding Deng and Yang Guo and Zhentao Li},
year = {2017},
doi = {10.1007/s10836-017-5656-y},
url = {http://dx.doi.org/10.1007/s10836-017-5656-y},
researchr = {https://researchr.org/publication/DengGL17},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {33},
number = {2},
pages = {157-169},
}