Building an Automatic Defect Verification System Using Deep Neural Network for PCB Defect Classification

Yu-Shan Deng, An-Chun Luo, Ming-Ji Dai. Building an Automatic Defect Verification System Using Deep Neural Network for PCB Defect Classification. In 4th International Conference on Frontiers of Signal Processing, ICFSP 2018, Poitiers, France, September 24-27, 2018. pages 145-149, IEEE, 2018. [doi]

Abstract

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