Xi Deng, Runze Yu, Zhenhao Li, Haoming Zhang, Zhenglin Liu. A Low-Power Variation-Tolerant 7T SRAM With Enhanced Read Sensing Margin for Voltage Scaling. IEEE Trans. on CAD of Integrated Circuits and Systems, 43(8):2354-2364, August 2024. [doi]
@article{DengYLZL24,
title = {A Low-Power Variation-Tolerant 7T SRAM With Enhanced Read Sensing Margin for Voltage Scaling},
author = {Xi Deng and Runze Yu and Zhenhao Li and Haoming Zhang and Zhenglin Liu},
year = {2024},
month = {August},
doi = {10.1109/TCAD.2024.3367233},
url = {https://doi.org/10.1109/TCAD.2024.3367233},
researchr = {https://researchr.org/publication/DengYLZL24},
cites = {0},
citedby = {0},
journal = {IEEE Trans. on CAD of Integrated Circuits and Systems},
volume = {43},
number = {8},
pages = {2354-2364},
}