Alain Denise, Marie-Claude Gaudel, Sandrine-Dominique Gouraud, Richard Lassaigne, Sylvain Peyronnet. Uniform random sampling of traces in very large models. In Johannes Mayer, Robert G. Merkel, editors, Proceedings of the 1st International Workshop on Random Testing, RT 2006, Portland, Maine, July 20, 2006. pages 10-19, ACM, 2006. [doi]
Abstract is missing.