Frederik L. Dennig, Tom Polk, Zudi Lin, Tobias Schreck, Hanspeter Pfister, Michael Behrisch 0001. FDive: Learning Relevance Models Using Pattern-based Similarity Measures. In Remco Chang, Daniel A. Keim, Ross Maciejewski, editors, 2019 IEEE Conference on Visual Analytics Science and Technology, VAST 2019, Vancouver, BC, Canada, October 20-25, 2019. pages 69-80, IEEE, 2019. [doi]
Abstract is missing.