Harmander Deogun, Dennis Sylvester, David Blaauw. Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 175-180, IEEE Computer Society, 2005. [doi]
@inproceedings{DeogunSB05,
title = {Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate},
author = {Harmander Deogun and Dennis Sylvester and David Blaauw},
year = {2005},
doi = {10.1109/ISQED.2005.61},
url = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2005.61},
researchr = {https://researchr.org/publication/DeogunSB05},
cites = {0},
citedby = {0},
pages = {175-180},
booktitle = {6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA},
publisher = {IEEE Computer Society},
isbn = {0-7695-2301-3},
}