Harmander Deogun, Dennis Sylvester, David Blaauw. Gate-Level Mitigation Techniques for Neutron-Induced Soft Error Rate. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 175-180, IEEE Computer Society, 2005. [doi]
Abstract is missing.