Simon-Frédéric Désage, Gilles Pitard, Maurice Pillet, Hugues Favrelière, Fabrice Frelin, Serge Samper, Gaëtan Le Goïc, Laurent Gwinner, Pierre Jochum. Visual Quality Inspection and Fine Anomalies: Methods and Application. In Svetan M. Ratchev, editor, Precision Assembly Technologies and Systems - 7th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2014, Chamonix, France, February 16-18, 2014, Revised Selected Papers. Volume 435 of IFIP Advances in Information and Communication Technology, pages 94-106, Springer, 2014. [doi]
@inproceedings{DesagePPFFSGGJ14,
title = {Visual Quality Inspection and Fine Anomalies: Methods and Application},
author = {Simon-Frédéric Désage and Gilles Pitard and Maurice Pillet and Hugues Favrelière and Fabrice Frelin and Serge Samper and Gaëtan Le Goïc and Laurent Gwinner and Pierre Jochum},
year = {2014},
doi = {10.1007/978-3-662-45586-9_13},
url = {http://dx.doi.org/10.1007/978-3-662-45586-9_13},
researchr = {https://researchr.org/publication/DesagePPFFSGGJ14},
cites = {0},
citedby = {0},
pages = {94-106},
booktitle = {Precision Assembly Technologies and Systems - 7th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2014, Chamonix, France, February 16-18, 2014, Revised Selected Papers},
editor = {Svetan M. Ratchev},
volume = {435},
series = {IFIP Advances in Information and Communication Technology},
publisher = {Springer},
isbn = {978-3-662-45585-2},
}