Simon-Frédéric Désage, Gilles Pitard, Maurice Pillet, Hugues Favrelière, Fabrice Frelin, Serge Samper, Gaëtan Le Goïc, Laurent Gwinner, Pierre Jochum. Visual Quality Inspection and Fine Anomalies: Methods and Application. In Svetan M. Ratchev, editor, Precision Assembly Technologies and Systems - 7th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2014, Chamonix, France, February 16-18, 2014, Revised Selected Papers. Volume 435 of IFIP Advances in Information and Communication Technology, pages 94-106, Springer, 2014. [doi]
Abstract is missing.