Hervé Deshayes. Cost of test reduction. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 265-271, IEEE Computer Society, 1998. [doi]
@inproceedings{Deshayes98,
title = {Cost of test reduction},
author = {Hervé Deshayes},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930265abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/Deshayes98},
cites = {0},
citedby = {0},
pages = {265-271},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}