Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction

Rao Desineni, R. D. (Shawn) Blanton. Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 366-373, IEEE Computer Society, 2005. [doi]

Authors

Rao Desineni

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R. D. (Shawn) Blanton

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