Universal test generation using fault tuples

Rao Desineni, Kumar N. Dwarakanath, Ronald D. Blanton. Universal test generation using fault tuples. In Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000. pages 812-819, IEEE Computer Society, 2000.

Authors

Rao Desineni

This author has not been identified. Look up 'Rao Desineni' in Google

Kumar N. Dwarakanath

This author has not been identified. Look up 'Kumar N. Dwarakanath' in Google

Ronald D. Blanton

This author has not been identified. Look up 'Ronald D. Blanton' in Google