Pierre-Francois Desrumaux, Yoan Dupret, Jens Tingleff, Sean Minehane, Mark Redford, Laurent Latorre, Pascal Nouet. An efficient control variates method for yield estimation of analog circuits based on a local model. In 2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012. pages 415-421, IEEE, 2012. [doi]
@inproceedings{DesrumauxDTMRLN12,
title = {An efficient control variates method for yield estimation of analog circuits based on a local model},
author = {Pierre-Francois Desrumaux and Yoan Dupret and Jens Tingleff and Sean Minehane and Mark Redford and Laurent Latorre and Pascal Nouet},
year = {2012},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=6386701},
researchr = {https://researchr.org/publication/DesrumauxDTMRLN12},
cites = {0},
citedby = {0},
pages = {415-421},
booktitle = {2012 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2012, San Jose, CA, USA, November 5-8, 2012},
publisher = {IEEE},
}