Kai-Oliver Detken, Stefan Edelkamp, Carsten Elfers, Malte Humann, Thomas Rix. Intelligent monitoring with background knowledge. In IEEE 8th International Conference on Intelligent Data Acquisition and Advanced Computing Systems: Technology and Applications, IDAACS 2015, Warsaw, Poland, September 24-26, 2015. pages 165-170, IEEE, 2015. [doi]
Abstract is missing.