V. R. Devanathan, C. P. Ravikumar, Rajat Mehrotra, V. Kamakoti. PMScan : A power-managed scan for simultaneous reduction of dynamic and leakage power during scan test. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]
Abstract is missing.