B. Devika, Neetha George. Convolutional Neural Network for Semiconductor Wafer Defect Detection. In 10th International Conference on Computing, Communication and Networking Technologies, ICCCNT 2019, Kanpur, India, July 6-8, 2019. pages 1-6, IEEE, 2019. [doi]
@inproceedings{DevikaG19,
title = {Convolutional Neural Network for Semiconductor Wafer Defect Detection},
author = {B. Devika and Neetha George},
year = {2019},
doi = {10.1109/ICCCNT45670.2019.8944584},
url = {https://doi.org/10.1109/ICCCNT45670.2019.8944584},
researchr = {https://researchr.org/publication/DevikaG19},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {10th International Conference on Computing, Communication and Networking Technologies, ICCCNT 2019, Kanpur, India, July 6-8, 2019},
publisher = {IEEE},
isbn = {978-1-5386-5906-9},
}