B. Devika, Neetha George. Convolutional Neural Network for Semiconductor Wafer Defect Detection. In 10th International Conference on Computing, Communication and Networking Technologies, ICCCNT 2019, Kanpur, India, July 6-8, 2019. pages 1-6, IEEE, 2019. [doi]
No references recorded for this publication.
No citations of this publication recorded.