Nicolas Devos, Christophe Ponsard, Jean-Christophe Deprez, Renaud Bauvin, Benedicte Moriau, Guy Anckaerts. Efficient reuse of domain-specific test knowledge: An industrial case in the smart card domain. In Martin Glinz, Gail C. Murphy, Mauro Pezzè, editors, 34th International Conference on Software Engineering, ICSE 2012, June 2-9, 2012, Zurich, Switzerland. pages 1123-1132, IEEE, 2012. [doi]
Abstract is missing.