Piet Dewaele, Luc Van Gool, Patrick Wambacq, André Oosterlinck. Texture inspection with self-adaptive convolution filters. In 9th International Conference on Pattern Recognition, ICPR 1988, 14-17 November 1988, Ergife Palace Hotel, Rome, Italy. pages 56-60, IEEE, 1988. [doi]
@inproceedings{DewaeleGWO88,
title = {Texture inspection with self-adaptive convolution filters},
author = {Piet Dewaele and Luc Van Gool and Patrick Wambacq and André Oosterlinck},
year = {1988},
doi = {10.1109/ICPR.1988.28171},
url = {https://doi.org/10.1109/ICPR.1988.28171},
researchr = {https://researchr.org/publication/DewaeleGWO88},
cites = {0},
citedby = {0},
pages = {56-60},
booktitle = {9th International Conference on Pattern Recognition, ICPR 1988, 14-17 November 1988, Ergife Palace Hotel, Rome, Italy},
publisher = {IEEE},
}