Tamal K. Dey, Joachim Giesen, Edgar A. Ramos, Bardia Sadri. Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction. Int. J. Comput. Geometry Appl., 18(1/2):29-61, 2008. [doi]
@article{DeyGRS08, title = {Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction}, author = {Tamal K. Dey and Joachim Giesen and Edgar A. Ramos and Bardia Sadri}, year = {2008}, doi = {10.1142/S0218195908002532}, url = {http://dx.doi.org/10.1142/S0218195908002532}, tags = {rule-based, data-flow, Epsilon}, researchr = {https://researchr.org/publication/DeyGRS08}, cites = {0}, citedby = {0}, journal = {Int. J. Comput. Geometry Appl.}, volume = {18}, number = {1/2}, pages = {29-61}, }