Tamal K. Dey, Joachim Giesen, Edgar A. Ramos, Bardia Sadri. Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction. Int. J. Comput. Geometry Appl., 18(1/2):29-61, 2008. [doi]
@article{DeyGRS08,
title = {Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction},
author = {Tamal K. Dey and Joachim Giesen and Edgar A. Ramos and Bardia Sadri},
year = {2008},
doi = {10.1142/S0218195908002532},
url = {http://dx.doi.org/10.1142/S0218195908002532},
tags = {rule-based, data-flow, Epsilon},
researchr = {https://researchr.org/publication/DeyGRS08},
cites = {0},
citedby = {0},
journal = {Int. J. Comput. Geometry Appl.},
volume = {18},
number = {1/2},
pages = {29-61},
}