Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction - researchr publication

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Tamal K. Dey, Joachim Giesen, Edgar A. Ramos, Bardia Sadri. Critical Points of Distance to an epsilon-Sampling of a Surface and Flow-Complex-Based Surface Reconstruction. Int. J. Comput. Geometry Appl., 18(1/2):29-61, 2008. [doi]

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