Sabyasachi Deyati, Aritra Banerjee, Barry John Muldrey, Abhijit Chatterjee. VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests. In 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, Pune, India, January 5-10, 2013. pages 314-319, IEEE, 2013. [doi]
@inproceedings{DeyatiBMC13,
title = {VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests},
author = {Sabyasachi Deyati and Aritra Banerjee and Barry John Muldrey and Abhijit Chatterjee},
year = {2013},
doi = {10.1109/VLSID.2013.207},
url = {http://doi.ieeecomputersociety.org/10.1109/VLSID.2013.207},
researchr = {https://researchr.org/publication/DeyatiBMC13},
cites = {0},
citedby = {0},
pages = {314-319},
booktitle = {26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, Pune, India, January 5-10, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4639-9},
}