VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests - researchr publication

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Sabyasachi Deyati, Aritra Banerjee, Barry John Muldrey, Abhijit Chatterjee. VAST: Post-Silicon VAlidation and Diagnosis of RF/Mixed-Signal Circuits Using Signature Tests. In 26th International Conference on VLSI Design and 12th International Conference on Embedded Systems, Pune, India, January 5-10, 2013. pages 314-319, IEEE, 2013. [doi]

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