CADless laser assisted methodologies for failure analysis and device reliability

A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis. CADless laser assisted methodologies for failure analysis and device reliability. Microelectronics Reliability, 50(9-11):1236-1240, 2010. [doi]

Authors

A. Deyine

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Kevin Sanchez

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Philippe Perdu

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F. Battistella

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Dean Lewis

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