A. Deyine, Kevin Sanchez, Philippe Perdu, F. Battistella, Dean Lewis. CADless laser assisted methodologies for failure analysis and device reliability. Microelectronics Reliability, 50(9-11):1236-1240, 2010. [doi]
@article{DeyineSPBL10,
title = {CADless laser assisted methodologies for failure analysis and device reliability},
author = {A. Deyine and Kevin Sanchez and Philippe Perdu and F. Battistella and Dean Lewis},
year = {2010},
doi = {10.1016/j.microrel.2010.07.131},
url = {http://dx.doi.org/10.1016/j.microrel.2010.07.131},
tags = {analysis, reliability},
researchr = {https://researchr.org/publication/DeyineSPBL10},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {50},
number = {9-11},
pages = {1236-1240},
}