A Probabilistic Model to Predict the Time Out of Service for Electronic Devices

Eralda Gjika Dhamo, Lule Basha Hallaçi, Ana Ktona. A Probabilistic Model to Predict the Time Out of Service for Electronic Devices. In Endrit Xhina, Klesti Hoxha, editors, Proceedings of the 3rd International Conference on Recent Trends and Applications in Computer Science and Information Technology, RTA-CSIT 2018, Tirana, Albania, November 23rd - 24th, 2018. Volume 2280 of CEUR Workshop Proceedings, pages 11-16, CEUR-WS.org, 2018. [doi]

Abstract

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