Abhijit Dharchoudhury, S. M. Kang. Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis. In Proceedings of the Fifth International Conference on VLSI Design, VLSI Design 1992, Bangalore, India, January 4-7, 1992. pages 339-340, IEEE Computer Society, 1992. [doi]
@inproceedings{DharchoudhuryK92-0,
title = {Identification of Correlated Device Model Parameter Values for Worst-Case Circuit Performance Analysis},
author = {Abhijit Dharchoudhury and S. M. Kang},
year = {1992},
doi = {10.1109/ICVD.1992.658079},
url = {http://dx.doi.org/10.1109/ICVD.1992.658079},
researchr = {https://researchr.org/publication/DharchoudhuryK92-0},
cites = {0},
citedby = {0},
pages = {339-340},
booktitle = {Proceedings of the Fifth International Conference on VLSI Design, VLSI Design 1992, Bangalore, India, January 4-7, 1992},
publisher = {IEEE Computer Society},
isbn = {0-8186-2465-5},
}