Efficient Delay Fault Characterization of Resistive Open Defects in Standard Cells Using Resistive Fault Dominance - researchr publication authors

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Gowsika Dharmaraj, Abhijit Chatterjee, Adit D. Singh, Arani Sinha. Efficient Delay Fault Characterization of Resistive Open Defects in Standard Cells Using Resistive Fault Dominance. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 281-290, IEEE, 2025. [doi]

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