IC Immunity Modeling Process Validation Using On-Chip Measurements - researchr publication authors

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S. Ben Dhia, Alexandre Boyer, Bertrand Vrignon, Mikaël Deobarro. IC Immunity Modeling Process Validation Using On-Chip Measurements. J. Electronic Testing, 28(3):339-348, 2012. [doi]

This author has not been identified. Look up 'S. Ben Dhia' in GoogleThis author has not been identified. Look up 'Alexandre Boyer' in GoogleThis author has not been identified. Look up 'Bertrand Vrignon' in GoogleThis author has not been identified. Look up 'Mikaël Deobarro' in Google

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