Najmeddine Dhieb, Hakim Ghazzai, Hichem Besbes, Yehia Massoud. A Very Deep Transfer Learning Model for Vehicle Damage Detection and Localization. In 31st International Conference on Microelectronics, ICM 2019, Cairo, Egypt, December 15-18, 2019. pages 158-161, IEEE, 2019. [doi]
Abstract is missing.