Harshad Dhotre, Mehdi Dehbashi, Ulrike Pfannkuchen, Klaus Hofmann. Automated Optimization of Scan Chain Structure for Test Compression-Based Designs. In 25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016. pages 185-190, IEEE Computer Society, 2016. [doi]
@inproceedings{DhotreDPH16,
title = {Automated Optimization of Scan Chain Structure for Test Compression-Based Designs},
author = {Harshad Dhotre and Mehdi Dehbashi and Ulrike Pfannkuchen and Klaus Hofmann},
year = {2016},
doi = {10.1109/ATS.2016.60},
url = {http://doi.ieeecomputersociety.org/10.1109/ATS.2016.60},
researchr = {https://researchr.org/publication/DhotreDPH16},
cites = {0},
citedby = {0},
pages = {185-190},
booktitle = {25th IEEE Asian Test Symposium, ATS 2016, Hiroshima, Japan, November 21-24, 2016},
publisher = {IEEE Computer Society},
isbn = {978-1-5090-3809-1},
}