Model coupling for predicting a developmental patterning process

Nimit Dhulekar, Basak Oztan, Bülent Yener. Model coupling for predicting a developmental patterning process. In Metin N. Gurcan, Anant Madabhushi, editors, Medical Imaging 2016: Digital Pathology, San Diego, California, United States, 27 February - 3 March 2016. Volume 9791 of SPIE Proceedings, pages 979104, SPIE, 2016. [doi]

Abstract

Abstract is missing.