Pragya Dhungana, Rupesh Kumar Singh, Hariom Dhungana. Machine Learning Model for Fault Detection in Safety Critical System. In Francesco Bellotti, Miltos D. Grammatikakis, Ali Mansour, Massimo Ruo Roch, Ralf Seepold, Agusti Solanas, Riccardo Berta, editors, Applications in Electronics Pervading Industry, Environment and Society - APPLEPIES 2023, Genoa, Italy, 28-29 September 2023. Volume 1110 of Lecture Notes in Electrical Engineering, pages 499-507, Springer, 2023. [doi]
Abstract is missing.