Polarimetric Thermal to Visible Face Verification via Self-Attention Guided Synthesis

Xing Di, Benjamin S. Riggan, Shuowen Hu, Nathaniel J. Short, Vishal M. Patel. Polarimetric Thermal to Visible Face Verification via Self-Attention Guided Synthesis. In 2019 International Conference on Biometrics, ICB 2019, Crete, Greece, June 4-7, 2019. pages 1-8, IEEE, 2019. [doi]

Authors

Xing Di

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Benjamin S. Riggan

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Shuowen Hu

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Nathaniel J. Short

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Vishal M. Patel

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